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多层膜型XRF分析晶体
- 品牌：德国Incoatec
- 型号： Multilayers XS-55, XS-N, XS-C, XS-B
- 产地：德国
- 供应商报价： 面议
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北京众星联恒科技有限公司
更新时间：2021-09-23 13:50:26 -
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入驻年限第10年
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- 详细介绍
Multilayers XS-55, XS-N, XS-C, XS-B
Multilayers are not natural crystals but artificially produced “layer analyzers.” The lattice plane distances d
are produced by applying thin layers of two materials in alternation onto a substrate (Fig. 18). Multilayers
are characterized by high reflectivity and a somewhat reduced resolution. For the analysis of light
elements the multilayer technique presents an almost revolutionary improvement for numerous
applications in comparison to natural crystals with large lattice plane distances.
Fig. 18: Diffraction in the layers of a multilayer crystal
XS-55:
The most commonly used multilayer with a 2d-value of 5.5 nm for analyzing the elements N to Al and Ca
to Br; standard application for measuring the elements F, Na and Mg.
