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SemiconductorThinFilm:AlxGa1-xAsEpitaxialLayers(Almolefractionxnear0.20),标准物质
- 品牌:坛墨质检
- 货号: SRM2841
- CAS编号:
- 产地:大兴区
- 供应商报价: ¥ 25620
- 坛墨质检科技股份有限公司 更新时间:2024-03-13 10:22:43
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- 详细介绍
- SemiconductorThinFilm:AlxGa1-xAsEpitaxialLayers(Almolefractionxnear0.20),标准物质 有效期: 无 标准值: 无 Semiconductor thin film
Al mole fraction x near 0.20
This Standard Reference Material (SRM®) is intended for use as a reference standard for analytical methods that
measure the composition of thin films, such as electron microprobe analysis (EMPA), photoluminescence (PL),
auger electron spectroscopy (AES) and X-ray photoelectron spectroscopy (XPS). A unit of NIST-2841 consists of
an epitaxial layer of AlxGa1-xAs with certified Al mole fraction x grown on a GaAs substrate mounted to a stainless
steal disc by the use of adhesive tape. Each unit is sealed in a Mylar envelope containing a nitrogen atmosphere.
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