SolidGear SD4.1总线协议分析仪
UFS4.0/UFS3.1/Unipro总线协议分析仪
Prodigy嵌入式接口协议分析仪
MIPI D-PHY DSI/CSI总线协议分析仪
SD/SDIO/eMMC5.1总线协议分析仪(Protocol Anlayzer)
UFS4.0/UFS3.1/Unipro总线协议分析仪(Analyzer)& 训练器(Exerciser):
UFS协议一致性测试,UFS4.0协议分析仪,UFS4.0 Protocol Analyzer, UFS/Unipro协议分析仪,UFS/Unipro Analyzer, UFS协议一致性测试,UFS Analyzer & Exerciser, UFS训练器, UFS模组测试
市场的UFS/Unipro总线协议分析仪厂商,支持MIPI M-PHY v5.0 GEAR5, UniPro v2.0 and UFS v4.0等规格测试并支持向下兼容。
Protocol Insight 为开发移动设备的客户提供测试和测量工具,并为UFS的工程师提供咨询和设计服务, Supported all UniPro and UFS Interoperability (IOT) workshops since the initial events in 2015,是UFSA协会推荐并认证的用于UFS总线协议测试的厂商。Protocol Insight 是 UFS 和 MIPI 专家,具有 M-PHY 和 D-PHY 协议练习器和分析仪的背景。Protocol Insight 通过 UniPro 和测试工作组为 UniPro 标准的开发做出贡献,并担任 MIPI® 与 JEDEC® 和 UFSA 之间的联络人。
The UFS/Unipro bus protocol analyzer manufacturer, ranked first in global market share, supports MIPI M-PHY v5.0 GEAR5, UniPro v2.0, and UFS v4.0 specification testing and downward compatibility.
Protocol Insight provides testing and measurement tools for mobile device development clients, as well as consulting and design services for UFS engineers. Supported all UniPro and UFS Interoperability (IOT) workshops since the initial events in 2015, it is the only official recommended and certified manufacturer by the UFSA Association for UFS bus protocol testing.
Protocol Insight is an expert in UFS and MIPI, with a background in M-PHY and D-PHY protocol practitioners and analyzers. Protocol Insight contributed to the development of UniPro standards through UniPro and testing teams, and served as MIPI ® With JEDEC ® The contact person between UFSA.
深圳市锐测电子科技(Reetest)专注于提供针对各种芯片总线接口协议/Serdes/器件/系统级产品从物理层至协议层的测试解决方案,覆盖R&D测试验证,RDT可靠性测试,芯片量产测试, AE/FAE等各个产品生命周期的测试。公司针对每一个产品线均有配备非常专业且富有经验的技术支持工程师提供local的产品售前售后技术支持服务。

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CRTB MIPI C-PHY Reference Termination Board Enables measurement of C-PHY signals at v1.2 and v2.0 symbol rates
DRTB MIPI D-PHY Reference Termination Board Enables measurement of D-PHY signals at v1.2 and v2.0 symbol rates
M5512 GDDR7 Memory Test System ATE-on-Bench for GDDR7 Characterization and Test