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德国LaVision ParticleMaster-IMI 干涉米氏粒径测量
- 品牌:德国LaVision
- 型号: LaVision ParticleMaster-IMI
- 产地:德国
- 供应商报价: 面议
- 北京欧兰科技发展有限公司 更新时间:2022-03-04 17:31:39
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企业性质
入驻年限第4年
营业执照
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- 详细介绍
Interferometric Mie Imaging
LaVision’s ParticleMaster IMI imaging system is optimized for spray investigations of smaller droplets at low and medium droplet densities. Defocused Mie scattering is used to generate a fringe pattern from each droplet with its fringe spacing related to the droplet size. This intererometric sizing method is limited to transparent and spherical droplets. The ParticleMaster IMI system is hardware compatible with LaVision’s FlowMaster 2D or Stereo PIV systems.
ParticleMaster IMISystem Featuresautodetection with droplet location from a single camera
droplet size from fringe pattern analysis
droplet velocity derived from double frame exposures
velocity - size correlations, histograms, scatterplots
Shadowgraphy vs. Interferometric Mie Imaging
Both, ParticleMaster Shadow and IMI are based on imaging techniques to measure particle size. Their limit to smaller size is determined by the nature of light. While the shadowgraphy technique uses a direct image, IMI is based on coherent light scattering and allows to extend the range of detectable droplets to even smaller sizes.
- 米氏酸(=2,2-二甲基-1,3-二氧六环-4,6-二酮), ≥98.0%
- 米氏酸(=2,2-二甲基-1,3-二氧六环-4,6-二酮), ≥98.0%
- 3-氨丙基功能性硅胶,粒径40-63 μm,~1 mmol/g NH2
- 硅酸锆,粒径1μm-1.2μm
- Nicomp380Z3000纳米粒径与电位分析仪
- AccuSizer780 AD多功能自动计数粒径检测仪
- 梅特勒-托利多实时粒径与粒数分析仪 ParticleTrack G400
- 梅特勒-托利多实时粒径与粒数分析仪 ParticleTrack G400
- 梅特勒-托利多实时粒径与粒数分析仪 ParticleTrack G400
- 梅特勒-托利多实时粒径与粒数分析仪 ParticleTrack G400
- 粒径标准品150-650 μm
- 粒径标准品50-350 μm