-
-
-
多功能扫描探针性纳米力学测试仪器
- 品牌：白罗斯MTM
- 型号： NT206
- 产地：欧洲 其它
- 供应商报价：€45000
-
北京伯英科技有限公司
更新时间：2025-03-03 16:19:19 -
销售范围售全国
入驻年限第8年
营业执照已审核
- 同类产品多功能扫描探针显微镜(1件)
立即扫码咨询
联系方式：400-822-6768
联系我们时请说明在仪器网（www.yiqi.com）上看到的!
扫 码 分 享 -
为您推荐
产品特点
- 多功能扫描探针显微镜，具有压痕与划痕功能，可原位成像，性价比好。
详细介绍
Measurement modes:
Motion patterns at the measurements:
- area (matrix);
- line;
- single point.Contact static AFM
Lateral force microscopy /with contact static AFM/
Non-contact dynamic AFM
Intermittent contact AFM (similar to Tapping Mode®)
Phase contrast imaging /with intermittent contact AFM/
Two-pass mode (for static and dynamic AFM)
Two-pass mode with varying separation (for static and dynamic AFM) /Original technique!/
Multicycle scanning (for static and dynamic AFM) /Original technique!/
Multilayer scanning with varying load (for static and dynamic AFM) /Original technique!/
Electrostatic force microscopy (two-pass technique) *, **
Current mode *, **
Magnetic force microscopy (two-pass technique) *, **
Static force spectroscopy (with calculation of quantitative parameters, surface energy and elastic modulus in the measurement point)
Dynamic force spectroscopy
Dynamic frequency force spectroscopy /Original technique!/
Nanoindentation *
Nanoscratching *
Linear nanowear *
Nanolithography (with control of load, depth and bias voltage) *
Microtribometry * /Original technique!/
Microadhesiometry * /Original technique!/
Shear-force microtribometry * /Original technique!/
Temperature-dependent measurements (under all above modes) *
Note.
* - Specialized accessories or rig required
** - Specialized probes requiredScan field area:
from 5x5 micron up to 50x40 microns
Maximum range of measured heights:
from 2 to 4 micron
Lateral resolution (plane XY):
1–5 nm (depending on sample hardness)
Vertical resolution (direction Z):
0.1–0.5 nm (depending on sample hardness)
Scanning matrix:
Up to 1024x1024 points
Scan rate:
40–250 points per second in X-Y plane
Nonlinearity correction :
A software nonlinearity correction provided
Minimum scanning step:
0.3 nm
Scanning scheme:
The sample is moved in X-Y plane (horizontal) and in Z-direction (vertical) under stationary probe.
Scanner type:
A piezoceramic tube.
Cantilevers (probes):
Commercial AFM cantilevers of 3.4x1.6x0.4 mm.
Recommended are probes from Mikromasch or NT-MDT. Checked for operation with probes by BudgetSensor and NanosensorsCantilever deflection detection system:
Laser beam scheme with four-quadrant position-sensitive photodetector
Sample size:
Up to 30x30x8 mm (w–d–h); extending block insert allows measurement of samples with height up to 35 mm
High voltage amplifier output:
+190 V
ADC:
16 bit
Operation environment:
Open air, 760+40 mm Hg col., T = 22+4°С, relative humidity <70%
Range of automated movement of measuring head:
10x10 mm in XY plane for micropositioning of probe relative measured sample at step 2.5 micron with optical visual monitoring
Overall dimensions:
Scanning unit: 185x185x290 mm
Control electronic unit: 195x470x210 mmField of view of embedded videosystem:
1x0.75 mm, visualization window 640x480 pixel, frame rate up to 30 fps.
Vibration isolation:
Additional antivibration table is recommended
Host computer:
Not less than: Celeron® 2.2, RAM 256 MB, HDD 80 GB, VRAM 128 MB, monitor 17" 1024x768x32 bit, Windows® XP SP1, 2 USB port.
Recommended: Core i5 or equivalent, RAM 2 GB, HDD 320 GB, VRAM 1 GB, monitor 1600x1200x32 bit, Windows® XP SP2 or higher, 2 free USB port.Software:
Special control software SurfaceScan and the AFM image processing package SurfaceView / SurfaceXplorer are included.
沪公网安备 31011502008050号