Contact Angle Measurements on Transistor Leadframes

Transistor leadframes were characterized by contact angle analysis using an FTÅ135. The leadframes were attached to their original stamping strip and it was desired to make the measurements without detachment. The FTÅ instrument demonstrated its ability to measure on "real world" samples. The resulting images were complex but the Region of Interest (ROI) capability allowed most of the image to be excluded so the correct drop profile could be determined.