介孔硅复合材料

Complete characterisation of the composite material structure was successfully carried out using the UVISEL Spectroscopic Phase Modulated Ellipsometer. Accurate and simultaneous determination of thickness, optical properties and anisotropy of the composite porous silica layer has been performed in the NIR/VIS range in order to investigate the nonlinear properties of the material. 研究级经典型椭偏仪 UVISEL