TESCAN LYRA3 FIB-SEM with integrated TOF-SIMS analyser
- 上传人: 泰思肯贸易(上海)有限公司 |大小:1.22MB|浏览:842次|时间:2021-05-21
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The unique combination of an FIB-SEM system from TESCAN and a Time-of-Flight (TOF) Secondary Ion Mass Spectrometer (SIMS) from TOFWERK represents a novel and cost-effective solution for material analysis. The user of the system is provided with information on the material composition (including light elements) and distribution of individual elements in the analysed volume.
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