The unique combination of an FIB-SEM system from TESCAN and a Time-of-Flight (TOF) Secondary Ion Mass Spectrometer (SIMS) from TOFWERK represents a novel and cost-effective solution for material analysis. The user of the system is provided with information on the material composition (including light elements) and distribution of individual elements in the analysed volume.
The unique combination of an FIB-SEM system from TESCAN and a Time-of-Flight (TOF) Secondary Ion Mass Spectrometer (SIMS) from TOFWERK represents a novel and cost-effective solution for material analysis. The user of the system is provided with information on the material composition (including light elements) and distribution of individual elements in the analysed volume. [详细]
Special optical fibers doped by various optically active elements are becoming increasingly important for the development of fiber optic components, sensors, and lasers. The optimization of optical fiber manufacturing requires the monitoring of spatial distribution of doping elements within the optical fiber core.[详细]
The development of a Time of Flight Secondary Ion Mass Spectrometer (TOF-SIMS) that can be
attached to a FIB-SEM instrument provides an analyzer that very well complements the standard EDS detector. However, contrary to EDS, it gives much better depth resolution, possibility of depth profiling as well as distinguishing isotopes. [详细]
Nanoscale mapping is achieved by multi-modal correlative microscopy combining focused ion beam and scanning electron microscopy (FIB-SEM) with Time-of-Flight Secondary Ion Mass Spectrometry (TOF-SIMS).Mapping Li, Mn and Co nanoscale distributions reveals the micro-structural consequences of the electrochemical reaction, and allows identifying Li “trapping” sites within the structure
[详细]
TESCAN LYRA3 FIB-SEM with integrated TOF-SIMS analyser
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