德国布鲁克 OPTIMUS 2

OPTIMUS Vue screen with a Si diode at its center for Bright Field (BF)-like imaging

Advanced alloys for minimized interference with e-beam

Additional new thin film in the screen active layer structure for improved signal quality

Optimized screen frame design for an improved user experience

OPTIMUS 2 will continue to be compatible with the standard TKD screen (without a center diode)

Improved spatial resolution through OPTIMUS Vue’s center diode, which provides the ideal conditions for optimizing beam focus and astigmatism settings before acquiring a TKD map.

Near real-time visualization of electron transparent samples during in-situ experiments in the SEM using the new ESPRIT TRM feature for Time Resolved Measurements.

Improved data integrity – high quality and high detail BF-like images are ideal input-data into the image correlation algorithms used by the ESPRIT DriftCorrection feature. The resulting gains in drift correction accuracy will be particularly beneficial for TKD maps, where even a beam or sample drift of just a few tens of nanometers will create visible artifacts in the map.

Productivity boost – BF-like images can be binarized using the new ESPRIT MaxYield feature and subsequently employed as masks for efficient mapping of regions of interest on sparse samples, like nanoparticles or nanorods.

Convenience, efficiency & success during the calibration procedure of the new ESPRIT FIL TKD (Full Immersion Lens TKD) feature enabling, for the first time ever, TKD mapping using the full immersion lens mode, also know as ultra-high resolution (UHR) mode, of certain electron columns.