COXEM台式扫描电镜在材料学中的应用-电子半导体

Flexibility in selecting and using operating parameters (accelerating voltage, specimen tilt, scan line time, etc) as well as correct analytical procedures are needed to obtain the maximum information when examining semiconductors and microelectronic devices. 库赛姆（COXEM）EM-30 Plus台式 扫描电镜