微区XRF（X射线分析显微镜）的指纹图像

微区XRF（X射线分析显微镜）的指纹图像 The fast and non-destructive elemental analysis provided by x-ray fluorescence (XRF), has long been known as a useful tool for forensic science. As microscopic capabilities in the technique have advanced, so its suitability to forensic analysis has increased, now allowing accurate analysis of minute material fragments (see Figure 1) such as paint chips, metals, glasses, and gun shot residues. 请发邮件至info-sci.cn@horiba.com，直接索取更多应用案例 X射线荧光分析显微镜 X射线荧光分析显微镜