表征非晶碳薄膜的厚度和光学常数

The UVISEL Spectroscopic Ellipsometer is the ideal tool for reliable film thickness and optical constants characterization of amorphous carbon coatings, even in difficult cases where the film thickness is very thin. Roughness, and interface adhesion can also been determined. ? 研究级经典型椭偏仪 UVISEL